International Light ILT2400辐照计和XSD340A探头组成的测量系统可用于PCB印刷线路板光刻胶工艺,可测量320-475nm光阻剂作用光谱,校准于405nm,光探测器可承受辐照强度范围8e-7至10W/cm2,NIST可溯源ISO17025认证校准报告,保证测量结果精确可靠。关于美国International Light XSD340A 紫外辐照计详细产品介绍请点击图片或网址http://www.testeb.com/XSD340A.html
美国International Light XSD340A 紫外辐照计
美国International Light XSD340A 紫外辐照计规格说明文档下载链接地址http://www.testeb.com/download/201805/ILT2400_Quick_Manual.pdf。(注)点击链接可直接阅读文档,或右键选择“另存为”保存到电脑。
SED254QT说明书:http://www.testeb.com/download/201805/ILT2400_SED254-QT.pdf
ST-513说明书:http://www.testeb.com/download/201508/Sentry_ST510-ST512-ST513.pdf
ILT2400-FARUVC说明书:https://www.intl-lighttech.com/products/ilt2400-faruvc-222nm-light-meter
XSD340B说明书:http://www.testeb.com/download/201805/ILT2400_XSD340_SD140.pdf
UVB说明书:http://www.testeb.com/download/201601/UV-A_UV-B_2.pdf